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#1 Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection [PDF] [Copy] [Kimi] [REL]

Authors: Jessica Plassmann, Nicolas Schuler, Michael Schuth, Georg von Freymann

Shearography is an interferometric technique sensitive to surface displacement gradients, providing high sensitivity for detecting subsurface defects in safety-critical components. A key limitation to industrial adoption is the lack of high-quality annotated datasets, since manual labeling remains labor-intensive, subjective, and difficult to standardize. We introduce an automated workflow that generates defect annotations from shearography measurements using deep learning, producing high-resolution segmentation and bounding-box labels. Evaluation against expert-labeled data demonstrates sufficient accuracy to enable weakly supervised training, reducing manual effort and supporting scalable dataset creation for robust defect detection.

Subject: Computer Vision and Pattern Recognition

Publish: 2025-12-05 21:49:58 UTC