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Spatial and temporal light modulation is a well-established technology that enables dynamic shaping of the phase and amplitude of optical fields, significantly enhancing the resolution and sensitivity of imaging methods. Translating this capability to electron beams is highly desirable within the framework of a transmission electron microscope (TEM) to benefit from the nanometer spatial resolution of these instruments. In this work, we report on the experimental realization of a photonic-based free-electron modulator integrated into the column of two ultrafast TEMs for pre-sample electron-beam shaping. Electron-photon interaction is employed to coherently modulate both the transverse and longitudinal components of the electron wave function, while leveraging dynamically controlled optical fields and tailored design of electron-laser-sample interaction geometry. Using energy- and momentum-resolved electron detection, we successfully reconstruct the shaped electron wave function at the TEM sample plane. These results demonstrate the ability to manipulate the electron wave function before probing the sample, paving the way for the future development of innovative imaging methods in ultrafast electron microscopy.