Total: 1
We investigate the high-ionization, narrow [Ne v] λ3427 emission line in a sample of over 340 ultrahard X-ray (14-195 keV) selected Active Galactic Nuclei (AGN) drawn from the BASS project. The analysis includes measurements in individual and stacked spectra, and considers several key AGN properties such as X-ray luminosity, supermassive black hole (SMBH) mass, Eddington ratios, and line-of-sight column density. The [Ne v] λ3427 line is robustly detected in ~43% (146/341) of the AGN in our sample, with no significant trends between the detection rate and key AGN/SMBH properties. In particular, the detection rate remains high even at the highest levels of obscuration (>70% for log[N_H/cm^-2] > 23). On the other hand, even some of our highest signal-to-noise spectra (S/N > 50) lack a robust [Ne v] detection. The typical (median) scaling ratios between [Ne v] line emission and (ultra-)hard X-ray emission in our sample are log L[Ne v]/L(14-150 keV) = -3.75 and log L[Ne v]/L(2-10 keV) = -3.36. The scatter on these scaling ratios, of ~0.5 dex, is comparable to, and indeed smaller than, what is found for other commonly used tracers of AGN radiative outputs (e.g., [O III] λ5007). Otherwise, we find no significant relations between the (relative) strength of [Ne v] and the basic AGN/SMBH properties under study, in contrast with simple expectations from models of SMBH accretion flows. Our results reaffirm the usability of [Ne v] as an AGN tracer even in highly obscured systems, including dual AGN and high redshift sources.