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We present a multi-probe transport analysis that effectively separates bulk and edge currents in large Hall bar devices with standard geometries. Applied to transport measurements on all possible four-probe configurations of six-probe Hall bar devices made of inverted three-layer InAs/GaInSb quantum wells (QWs), our analysis not only reveals the presence of dissipative edge currents in the topological gap, but also allows the temperature dependence of bulk and edge conductivity to be evaluated separately. The temperature dependence of the edge conductivity for Hall bar channels from 10 $\mu$m to 70~$\mu$m in the range of 1.5 K to 45 K is consistent with the theoretical expectation of weakly interacting helical edge electrons with backscattering due to localized magnetic moments of charge impurities. We argue that these charge impurities are naturally associated with intrinsic Ga-antisite defects, which act as double acceptors in InAs/Ga(In)Sb-based QWs.