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#1 WRT-SAM: Foundation Model-Driven Segmentation for Generalized Weld Radiographic Testing [PDF] [Copy] [Kimi] [REL]

Authors: Yunyi Zhou, Kun Shi, Gang Hao

Radiographic testing is a fundamental non-destructive evaluation technique for identifying weld defects and assessing quality in industrial applications due to its high-resolution imaging capabilities. Over the past decade, deep learning techniques have significantly advanced weld defect identification in radiographic images. However, conventional approaches, which rely on training small-scale, task-specific models on single-scenario datasets, exhibit poor cross-scenario generalization. Recently, the Segment Anything Model (SAM), a pre-trained visual foundation model trained on large-scale datasets, has demonstrated exceptional zero-shot generalization capabilities. Fine-tuning SAM with limited domain-specific data has yielded promising results in fields such as medical image segmentation and anomaly detection. To the best of our knowledge, this work is the first to introduce SAM-based segmentation for general weld radiographic testing images. We propose WRT-SAM, a novel weld radiographic defect segmentation model that leverages SAM through an adapter-based integration with a specialized prompt generator architecture. To improve adaptability to grayscale weld radiographic images, we introduce a frequency prompt generator module, which enhances the model's sensitivity to frequency-domain information. Furthermore, to address the multi-scale nature of weld defects, we incorporate a multi-scale prompt generator module, enabling the model to effectively extract and encode defect information across varying scales. Extensive experimental evaluations demonstrate that WRT-SAM achieves a recall of 78.87%, a precision of 84.04%, and an AUC of 0.9746, setting a new state-of-the-art (SOTA) benchmark. Moreover, the model exhibits superior zero-shot generalization performance, highlighting its potential for practical deployment in diverse radiographic testing scenarios.

Subject: Computer Vision and Pattern Recognition

Publish: 2025-02-17 01:31:36 UTC