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A GaN-based photodetector structure was optimized and modeled in the mesa region, incorporating a nickel-gold contact layer on a sapphire substrate to enhance ultraviolet (UV) detection. To further improve performance, an alternative design integrating thin InN (top) and AlN (buffer) layers was proposed. These additional layers were introduced to enhance carrier transport and optical absorption within the device. Following mesa thickness simulations, a silicon carbide (SiC) substrate was tested to assess its impact on detector performance. Each simulation phase aimed to optimize current-voltage (I-V) characteristics, photoabsorption rate, and spectral responsivity, ensuring the design approached realistic operational conditions. A new Sapphire/GaN(p-type)/GaN/GaN(n-type)/Ni/Au detector was designed based on the optimized buffer layer thicknesses in the mesa region, using parameters from the Sapphire/AlN/GaN/InN/Ni/Au structure. This new detector was further optimized as a function of doping concentration. Additionally, the contact electrode finger thickness and inter-finger spacing were geometrically refined to maximize performance. This comprehensive simulation study demonstrates a significant enhancement in photodetector response through structural and doping optimizations. Normalized I-V characteristics revealed a photocurrent increase of 1.16-fold to 1.38-fold at each optimization stage. Similarly, mesa region thickness optimizations improved the photoabsorption rate from 1.97e24 1/s . cm^3 to 2.18e24 1/s . cm^3. Furthermore, the spectral responsivity in the UV region increased from 0.28e-7 A to 0.47e-7 A at 367 nm.These results show significant improvements in the structural and electrical performance of GaN-based photodetectors, providing a promising way to develop high-efficiency UV detection devices.