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Isotopically enriched silicon (Si) can greatly enhance qubit coherence times by minimizing naturally occurring 29Si which has a non-zero nuclear spin. Ultra-high fluence 28Si ion implantation of bulk natural Si substrates was recently demonstrated as an attractive technique to ultra-high 28Si isotopic purity. In this work, we apply this 28Si enrichment process to produce 28Si and 28Si-on-insulator (SOI) samples. Experimentally, we produced a 28Si sample on natural Si substrate with 29Si depleted to 7~ppm (limited by measurement noise floor), that is at least 100 nm thick. This is achieved with an ion energy that results in a sputter yield of less than one and a high ion fluence, as supported by simulations. Further, our simulations predict the 29Si and 30Si depletion in our sample to be less than 1~ppm. In the case of SOI, ion implantation conditions are found to be more stringent than those of bulk natural Si in terms of minimizing threading dislocations upon subsequent solid phase epitaxy annealing. Finally, we report the observation of nanoscopic voids in our 28SOI and 28Si samples located in the depth region between the surface and 70~nm. These voids appear to be stabilized by the presence of gold impurities and can be annealed out completely by a standard SPE annealing protocol at 620\deg C for 10 minutes in the absence of gold.