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A persistent paradox complicates the study of plasma-irradiated thin films, where bimodal grain distributions and ambiguous scaling laws, roughly shifting between Φ−1/2 and Φ−1, or a general inverse dependence on plasma flux, are empirical yet remain theoretically unreconciled. Existing models fail to unify noise-driven evolution, defect saturation kinetics, and nucleation-loss balance within a single, self-consistent formalism. This work resolves these discrepancies by developing the first exact analytical theory for this system. We derive the closed-form steady-state grain area distribution, Pss(A), establish the precise dimensionless threshold for bimodality onset at Πc=4/(3√3), and demonstrate that defect saturation physics mandate a universal ⟨A⟩∝κ2Φ−1e+2Eb/kBTs scaling law. The framework reveals how competition between stochastic impingement and deterministic growth triggers microstructure fragmentation, resolving long-standing ambiguities in irradiation-induced surface evolution and providing a predictive foundation for materials processing.