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In this paper, we consider waveguide systems operating at subwavelength scales. A key feature of these systems is that they are high contrast periodic resonator systems with line defects, leading to resonant phenomena at subwavelength scales. Their spectral properties at the subwavelength scales can be approximated by using the capacitance matrix formulation. Our main objective is to investigate the exponential decay of the off-diagonal elements of the capacitance matrices associated with these waveguide systems. This decay property rigorously justifies a tight-binding approximation, which in turn enables a novel and efficient approach for computing the spectral properties of subwavelength resonators with non-compact defects. Various numerical experiments are provided to validate the theoretical results, including applications to topological interface modes.