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This work reports the fabrication and optical characterization of ultraviolet-emitting plastic scintillators based on polystyrene [-(CH2-CH(C6H5))n-] and polyvinyltoluene [-(CH2-CH(C6H4CH3))n-] doped with different concentrations of naphthalene (Naph). Photoluminescence (PL) measurements show that Naph incorporation enhances the emission intensity, inducing a red shift in the emission wavelength of the polystyrene (PS), while Naph-doped polyvinyltoluene (PVT) exhibits a bimodal emission with peaks around 335 and 350 nm. Time-resolved photoluminescence (TRPL) reveals fast decay components for the undoped matrices and a dominant slow component of approximately 87 ns in the doped samples. Scintillation light yield measurements indicate moderate performance for the undoped polymers and a significant enhancement upon Naph doping. Proton irradiation experiments reveal a reduction in light yield for all samples, with Naph-doped PVT retaining a larger fraction of its initial light yield compared to PS-based scintillators, indicating improved radiation tolerance. Overall, these results demonstrate the effectiveness of Naph as a UV emission enhancer and highlight Naph-doped PVT as a promising candidate for compact and radiation-resistant scintillation detectors.