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X-ray emission in solar flares is produced by both multi-thermal plasma and accelerated electrons. Classical imaging approaches reconstruct X-ray intensity maps which contain contributions from multiple spectral components (e.g., hot, superhot, and non-thermal), and do not allow retrieving the morphology of the different components separately. We introduce a novel imaging technique, called "Count-based spectral Component Imaging (CCI)", to jointly reconstruct spatially resolved emission measure maps of the thermal components, and the electron flux distribution of the non-thermal component from data provided by the Spectrometer/Telescope for Imaging X-rays (STIX) aboard Solar Orbiter. We formulate a linear model linking the Differential Emission Measure (DEM), approximated by two thermal components, and the non-thermal electron flux to the observed counts. The resulting inverse problem is solved with the Richardson-Lucy algorithm. We apply CCI to STIX observations of SOL2024-10-01T22 and compare it with the previously developed Spectral Component Imaging (SCI) method, as well as classical imaging approaches. The reconstructed thermal and non-thermal components show good agreement with those obtained using SCI. This proof-of-concept study shows that CCI obtains results consistent with SCI but with fewer inputs. In contrast with SCI, CCI can also be applied to hard X-ray focusing optics imaging.