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Fast pixelated detectors are driving 4D-STEM toward microsecond dwell times, a regime in which the finite response of the scan deflection coils becomes comparable to the dwell time itself. Using direct probe imaging and sub-frame diffraction analysis, we document a significant intra-dwell scan-coil delay that systematically smears the recorded signal anisotropically along the fast scan direction, with a settling timescale of several tens of microseconds. We present a phase-correlation-based sub-frame alignment procedure that measures and corrects this smearing, and we assess its impact on focused and defocused 4D-STEM reconstructions over a range of scan step sizes. The correction restores signal across a broad range of spatial frequencies, with the largest gains at the large step sizes required for low-dose biological imaging. Because it operates on existing data with no modification to the microscope, the method offers a practical route to recovering signal that would otherwise be lost to scan-coil delay.