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In their landmark paper introducing the atomic force microscope [Phys. Rev. Lett. \textbf{56}, 930 (1986)], Binnig, Quate, and Gerber presciently anticipated that the technique would ultimately be capable of probing interactions running the gamut from weak van der Waals interactions to strong covalent bonding. They also highlighted that the tip-sample forces central to AFM are present, and often highly influential, in scanning tunnelling microscopy; indeed, this realisation directly inspired the invention of the force microscope. In this perspective for the \textit{Forty Years of AFM} special issue, we review selected aspects of two decades of work from our group at the University of Nottingham that span the force range highlighted by BQG and are united by a common, central theme: the probe as active participant rather than passive observer. Our selection of results also covers length- and correlation-scales from the microscopic right down to the single chemical bond limit, tracking a spectrum of interactions from van der Waals/Hamaker forces, through hydrogen bonding, to covalent bonds and, finally, atom-by-atom assembly of metal clusters via vertical tip-sample transfer. Echoing BQG's own observations on the prevalence of probe-sample forces in STM, we also discuss recent evidence that tip-induced heterogeneity underpins first-passage dynamics in molecular diffusion and highlight the challenges in acquiring non-invasive measurements of diffusion barriers for adsorbed molecules that are readily perturbed by the probe. We close with a perspective on machine learning's growing role in automating tip-driven atomic and molecular manipulation.